Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) optically detects the scattered light from a sharp metallic tip. As the light scattering by the sharp tip depends on its surrounding materials, s-SNOM allows access to the sub-diffraction limited spatial resolution at optical and infrared frequencies. The initial concept was proposed by Edward H. Synge in 1928. Modern s-SNOM instrument was developed in the 1990s with the combination of atomic force microscopy and optical detection of scattered light. Our research group works on s-SNOM since 2015. We hope to improve s-SNOM with new instrument designs to reveal its full potential for nanoscale characterizations.
Peak force scattering-type scanning near-field optical microscopy (PF-SNOM)
Instead of using the commonly used tapping mode and lock-in detection, PF-SNOM uses the peak force tapping mode (also known as the pulsed force mode). It correlates the tip-sample distance with the near-field scattered light to obtain the vertical near-field signal dependence. After subtraction of the far-field background, PF-SNOM provides the tomographic near-field response with an explicit dependence of the tip-sample distance.
PF-SNOM also allows three-dimensional measurement of the near-field responses from nano- and microstructures, such as those made of polaritonic materials.
For more information, please see our PF-SNOM paper in Nature Communications 9:2005 (2018) and 3D near-field measurement with PF-SNOM in Nanoscale.
Ultra-broadband light source for Scattering-type scanning near-field optical microscopy